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1.	Image from Amazon.com	Empirical bayes and likelihood inference / Edited by S E Ahmed and N Reid by Ahmed, S E (ed.) Reid, N (ed.) Series: Lecture notes in statistics ; no.148 Material type: Text Language: English Publication details: New Delhi : Springers , 2001 Availability: Items available for reference: ST. THOMAS COLLEGE LIBRARY, PALAI: Reference Book (1)Location, call number: Statistics - Reference 519.542 AHM-E. Request article Save to lists Add to cart (remove)
2.	Image from Amazon.com	Nonlinear estimation and classification / Edited by David D Denison ...[et al] by Denison, David D (ed.) Series: Lecture notes in statistics ; no.171 Material type: Text Language: English Publication details: London : Springer , 2002 Availability: Items available for reference: ST. THOMAS COLLEGE LIBRARY, PALAI: Reference Book (1)Location, call number: Statistics - Reference 519.544 DAV-N. Request article Save to lists Add to cart (remove)
3.	Image from Amazon.com	Dependence in probability and statistics / edited by Patrice Bertail, Paul Doukhan and Philippe Soulier by Bertail, Patrice (ed.) Doukhan, Paul (ed.) Soulier, Philippe (ed.) Series: Lecture notes in statistics / edited by P Bickel ...[et al] Material type: Text Language: English Publication details: New York : Springer , 2006 Availability: Items available for reference: ST. THOMAS COLLEGE LIBRARY, PALAI: Reference Book (1)Location, call number: Statistics - Reference 519.2 PAT-D. Request article Save to lists Add to cart (remove)