Normal view MARC view ISBD view

Confidence intervals for process capability indices with respect to random effects models and autocorrelated data /

Jane A. Luke

Confidence intervals for process capability indices with respect to random effects models and autocorrelated data / by Jane A. Luke - Pala : July 2012 - 135p. Hard Back

ISBN: T164

Subjects--Topical Terms:
Statistics

Dewey Class. No.: 519 / JAN-C

Place hold
Print
Cite
Request article
Add to your cart (remove)
Send to device
Save record
BIBTEX Dublin Core ISBD MARC (non-Unicode/MARC-8) MARCXML MODS (XML) RIS MARC (Unicode/UTF-8)
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)